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Last edited anonymously
April 1, 2008 |
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International Workshop on Stress-Induced Phenomena in Metallization (7th 2004 Austin, Tex.)
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Stress-Induced Phenomena in Metallization: Seventh International Workshop on Stress-Induced Phenomena in Metallization (AIP Conference Proceedings / AIP ... Phenomena Metallizat.)
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International Workshop on Stress-Induced...
First published in 2004
2 editions
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Subjects
Aluminum films
Congresses
Copper
Damascening
Defects
Dielectric films
Electric properties
Electrodiffusion
Integrated circuits
Interconnects (Integrated circuit technology)
Metallic films
Metallizing
Semiconductors
Thin film devices
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ID Numbers
OLID: OL1397209A
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