{"name": "IEEE International Workshop on Memory Technology, Design and Testing (10th 2002 Isle of Bendor, France)", "last_modified": {"type": "/type/datetime", "value": "2008-04-01 03:28:50.625462"}, "key": "/authors/OL1509856A", "type": {"key": "/type/author"}, "id": 5167244, "revision": 1}