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Last edited by
MARC Bot
July 30, 2025 |
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Silva Kristine Theiss
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Lattice relaxation of Ge islands on Si(111) measured by scanning tunneling microscopy
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Silva Kristine Theiss
First published in 1995
1 edition
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Subjects
Analysis
Lattice dynamics
Microscopy
Scanning tunneling microscopy
Silicon
Surfaces
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ID Numbers
OLID: OL15697488A
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