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Martin G. Buehler

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Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements: videotape script.

by Martin G. Buehler First published in 1976 — 1 edition

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Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script

by Martin G. Buehler First published in 1976 — 1 edition

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Microelectronic test pattern NBS-3 for evaluating the resistivity-dopant density relationship of silicon

by Martin G. Buehler First published in 1976 — 1 edition

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Microelectronic test patterns: an overview

by Martin G. Buehler First published in 1974 — 1 edition

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Planar test structures for characterizing impurities in silicon

by Martin G. Buehler First published in 1976 — 1 edition

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Solid state radiation dosimeters for space and medical applications

by Martin G. Buehler First published in 1996 — 1 edition

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OLID: OL1948462A

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