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Subjects
Electrons, Diffraction, Electron microscopes, Electron microscopy, Metals, Physical metallurgy, Congresses, Crystallography, Defects, Electron Microscope Tomography, Electrons, diffraction, Fatigue, Fracture mechanics, Materials, Metallography, Metals, defects, Nondestructive testing, Physics, Solid state physics, Structural analysis (Engineering), Structural analysis (engineering)People
M. J. WhelanID Numbers
- OLID: OL2007668A
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