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Subjects
Characterization and Evaluation of Materials, Congresses, Crystallography, Effect of radiation on, Electronics, Halbleiter, Halbleiterbauelement, Instrumentation Electronics and Microelectronics, Optical and Electronic Materials, Optical materials, Physics, Porous materials, Semiconductors, Semiconductors, effect of radiation on, Strahlenschaden, Surfaces (Physics), Thin Films Surfaces and Interfaces, ZeolitesID Numbers
- OLID: OL2708079A
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