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Fred H. Pollak

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Spectroscopic characterization techniques for semiconductor technology: 9-10 November 1983, Cambridge, Massachusetts

by Robert S. Bauer and Fred H. Pollak First published in 1983
3 editions, 1 ebook
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Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions: final report

by Fred H. Pollak First published in 1990
2 editions

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Spectroscopic characterization techniques for semiconductor technology III: 14-15 March 1988, Newport Beach, California

by Fred H. Pollak, Fernando Ponce, and Orest J. Glembocki First published in 1988
2 editions, 1 ebook
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Layered structures: heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.

by B. W. Dodson, L. J. Schowalter, J. E. Cunningham, and Fred H. Pollak First published in 1990
2 editions, 1 ebook
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Spectroscopic characterization techniques for semiconductor technology II: January 21-22, 1985, Los Angeles, California

by Fred H. Pollak First published in 1985
1 edition, 1 ebook
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Modern optical characterization techniques for semiconductors and semiconductor devices

by Fred H. Pollak and Jin-Joo Song First published in 1987
1 edition

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Surface and interface analysis of microelectronic materials processing and growth: 12-13 October 1989, Santa Clara, California

by Fred H. Pollak First published in 1990
1 edition, 1 ebook
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Diagnostic Techniques for Semiconductor Materials Processing II: Symposium Held November 27-30, 1995, Boston, Massachusetts, U.S.A (Materials Research Society Symposium Proceedings)

by Orest J. Glembocki and Fred H. Pollak First published in 1996
1 edition

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OLID: OL3040272A

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