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April 30, 2008 | History

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Rajpal S. Sirohi

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Introduction to Optical Metrology

by Rajpal S. Sirohi First published in 2015
5 editions

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Holography and Speckle Phenomena and Their Industrial Applications: Proceedings of the International Workshop December 12-17 1988

by Rajpal S. Sirohi First published in 1990
2 editions, 1 ebook
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Optical Methods of Measurement

by Rajpal S. Sirohi First published in 2009
1 edition

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Selected Papers on Electronic Speckle Pattern Interferometry: Principles and Practice

by Klaus D. Hinsch, Peter Meinlschmidt, and Rajpal S. Sirohi First published in 1996
1 edition

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Speckle metrology

by Rajpal S. Sirohi First published in 1993
1 edition

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OLID: OL3310762A

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