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Last edited anonymously
April 30, 2008 |
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Ronald D. Schrimpf
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Defects in Microelectronic Materials and Devices
by
Daniel Fleetwood
,
Sokrates Pantolides
, and
Ronald D. Schrimpf
First published in 2008
4 editions
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Subjects
Circuits intégrés
Defects
Digital
Défauts
Electronics
Integrated circuits
Integrerade kretsar
Materials
Metal oxide semiconductor field-effect transistors
Microelectronics
Mikroelektronik
TECHNOLOGY & ENGINEERING
Testing
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ID Numbers
OLID: OL3756233A
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