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Manoj Sachdev

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

by Manoj Sachdev and José Pineda de Gyvez First published in 2007 — 3 editions

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Defect oriented testing for CMOS analog and digital circuits

by Manoj Sachdev First published in 1998 — 2 editions

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2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings

by IEEE International Workshop on Defect Ba..., Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, and Quebec) IEEE VLSI Test Symposium (2000 :... First published in 2000 — 2 editions

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

by Andrei Pavlov and Manoj Sachdev First published in 2010 — 1 edition

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Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)

by Arman Vassighi and Manoj Sachdev First published in 2006 — 1 edition

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Thermal and Power Management of Integrated Circuits

by Arman Vassighi and Manoj Sachdev First published in 2010 — 1 edition

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Thermal and Power Management of Integrated Circuits (Series on Integrated Circuits and Systems)

by Arman Vassighi and Manoj Sachdev First published in 2006 — 1 edition

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OLID: OL398968A

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