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Subjects
Computer vision, Congresses, Industrial applications, Image processing, Quality control, Automation, Engineering inspection, Optical methods, Artificial intelligence, Computer architecture, Optical measurements, Engineering, Imaging systems, Metrology, Pattern perception, Pattern recognition systems, Three-dimensional display systems, Automated Pattern Recognition, Automatisation, Bildverarbeitung, Biomedical engineering, Computer Bks - General Information, Computer engineering, Computer science, Computer-aided designID Numbers
- OLID: OL540384A
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![Cover of: Machine vision and three-dimensional imaging systems for inspection and metrology: 6-8 November 2001 [i.e. 2000], Boston, USA Cover of: Machine vision and three-dimensional imaging systems for inspection and metrology: 6-8 November 2001 [i.e. 2000], Boston, USA](http://covers.openlibrary.org/b/id/14354854-M.jpg)

