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October 26, 2008 | History

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Cher Ming Tan

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Born

1959

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Sample preparation for electrical characterizatin of MBE grown ZnSe film on Ge substrate.

by Cher Ming Tan First published in 1988
1 edition

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Microelectronic yield, reliability, and advanced packaging: 28-30 November 2000, Singapore

by Cher Ming Tan First published in 2000
1 edition, 1 ebook
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Electromigration in ULSI Interconnections

by Cher Ming Tan First published in 2010
1 edition

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Electromigration Modeling at Circuit Layout Level

by Cher Ming Tan First published in 2013
1 edition

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Applications of finite element methods for reliability studies on ULSI interconnections

by Cher Ming Tan First published in 2011
1 edition

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Band structure and electrical transport in n-i-n-i doping superlattices.

by Cher Ming Tan First published in 1992
1 edition

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We need a photo of Cher Ming Tan

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1959

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ID Numbers

OLID: OL5949998A

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