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Last edited by
ImportBot
August 30, 2010 |
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Scott Douglas Walck
Born
1954
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Depth profiling of low energy ions implanted into metals using the field ion microscope/imaging atom probe
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Scott Douglas Walck
First published in 1986
1 edition
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1 ebook
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Born
1954
Subjects
Field ion microscopes
Ion implantation
Microscope and microscopy
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ID Numbers
OLID: OL6824968A
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